纳米技术中的显微学手册

书籍目录

List of Contributors1 High\|Resolution Scanning Electron Microscopy　1.1 Introduction: Scanning Electron Microscopyand Nanotechnology　1.2 Electron\|Specimen Interactions5　　1.2.1 Electron\|Specimen Interactions in Homogeneous Materials　　1.2.2 Electron\|Speciment Interactions in Composite Samples  1.3 Instrumentation of/the Scanning Electron Microscope    1.3.1 General Description　　1.3.2 Performance of a Scanning Electron Microscope　1.4 The Resolution of Secondary and Backscattered Electron Images  1.5 Contrast Mechanisms of SE and BE Images of Nanoparticlesand Other Systems　　1.5.1 Small Particle Contrast in High\|Resolution BE Images　　1.5.2 Small Particle Contrast in High\|Resolution SE Images　　1.5.3 Other Contrast Mechanisms　1.6 Applications to Characterizing Nanophase Materials　1.7 Summary and Perspectives　References2 High Spatial Resolution Quantitative Electron BeamMicroanalysis for Nanoscale Materials　2.1 Introduction 　2.2 The Nanomaterials Characterization Challenge: Bulk Nanostructuresand Discrete Nanoparticles　　2.2.1 Bulk Nanostructures　　2.2.2 Nanoparticles　2.3 Physical Basis of the Electron\|Excited Analytical Spectrometries　2.4 Nanoscale Elemental Characterization with High Electron Beam Energy　　2.4.1 EELS　　2.4.2 X\|ray Spectrometry　2.5 Nanoscale Elemental Characterization with Low and Intermediate Electron Beam Energy　　2.5.1 Intermediate Beam Energy X\|ray Microanalysis　　2.5.2 Low Beam Energy X\|ray Microanalysis: Bulk Nanostructures　　2.5.3 Auger Spectrometry　　2.5.4 Elemental Mapping　2.6 Examples of Applications to Nanoscale Materials　　2.6.1 Analytical Electron Microscopy　　2.6.2 Low Voltage SEM　　2.6.3 Auger/X\|ray SEM　2.7 Conclusions　References3 Characterization of Nano\|Crystalline Materials Using ElectronBackscatter Diffraction in the Scanning Electron Microscope　3.1 Introduction　3.2 Historical Development of EBSD　3.3 Origin of EBSD Patterns　　3.3.1 Collection of EBSD Patterns　　3.3.2 Automated Orientation Mapping　3.4 Resolution of EBSD　　3.4.1 Lateral Resolution　　3.4.2 Depth Resolution　3.5 Sample Preparation of Nano\|Materials for EBSD　3.6 Applications of EBSD to Nano\|Materials　　3.6.1 Heteroepitaxy of Boron Arsenide on \[0001\] 6H\|Sic　　3.6.2 Electrodeposited Ni for MEMS Applications　　3.6.3 Polycrystalline Si For MEMS Applications　3.7 Summary　References4 High Resolution Transmission Electron Microscopy　4.1 HRTEM and Nanotechnology　4.2 Principles and Practice of HRTEM　　4.2.1 Basis of Image Formation　　4.2.2 Definitions of Resolution　　4.2.3 Lattice Imaging or Atomic Imaging　　4.2.4 Instrumental Parameters　　4.2.5 Further Requirements　　4.2.6 Milestones　4.3 Applications of HRTEM　　4.3.1 Semiconductors　　……5 Scanning Transmission Electron Microscopy6 In\|situ Electron Microscopy for Nanomeasurements7 Environmental Transmission Electron Microscopy  in Nanotechnology8 Electron Nanocrystallography9 Tomography Using the Transmission Electron Microscope10 Off\|Axis Electron Holography11 Sub\|nm Spatially Resolved EELS(Electron Energy\|Loss Spectroscopy):Methods,Theory and Applications12 Imaging Magnetic Structures Using TEMIndex

作者简介

纳米技术中的显微学手册（第2卷 电子显微学 英文版），ISBN：9787302097587，作者：姚楠，王中林主编

图书封面

 纳米技术中的显微学手册下载